Analysis on morphological and structural features of graphene layers by using polarization indirect microscopic imaging system

Guoyan Liu; Kun Gao; Guoqiang Ni; Xuefeng Liu

doi:10.1117/12.2195263

Analysis on morphological and structural features of graphene layers by using polarization indirect microscopic imaging system

Guoyan Liu, Kun Gao, Guoqiang Ni, Xuefeng Liu

光电学院

科研成果: 书/报告/会议事项章节 › 会议稿件 › 同行评审

2 引用（Scopus）

摘要

Simple polarization indirect microscopic imaging can visualize graphene layer's dimensions features, however, its limited resolution makes it impossible to analyze the other physical characteristics. Our research uses polarization parameter indirect microscopic imaging system with super-resolution to modulate the variation of far field point spread function with varying polarization status and improve wavefront aberration, sensor error, and polarization angle. This method has much higher sensitivity to graphene overlapping layers, edges, wrinkles and grain boundaries. Finally, this technique for graphene inspection that is capable of reaching super-resolution.

源语言	英语
主期刊名	2015 International Conference on Optical Instruments and Technology
主期刊副标题	Micro/Nano Photonics and Fabrication, OIT 2015
编辑	Pavel Cheben, Zhiping Zhou, Changhe Zhou
出版商	SPIE
ISBN（电子版）	9781628418057
DOI	https://doi.org/10.1117/12.2195263
出版状态	已出版 - 2015
活动	2015 International Conference on Optical Instruments and Technology: Micro/Nano Photonics and Fabrication, OIT 2015 - Beijing, 中国期限: 17 5月 2015 → 19 5月 2015

出版系列

姓名	Proceedings of SPIE - The International Society for Optical Engineering
卷	9624
ISSN（印刷版）	0277-786X
ISSN（电子版）	1996-756X

会议

会议	2015 International Conference on Optical Instruments and Technology: Micro/Nano Photonics and Fabrication, OIT 2015
国家/地区	中国
市	Beijing
时期	17/05/15 → 19/05/15

访问文件

10.1117/12.2195263

其它文件与链接

链接到 Scopus 的出版物

引用此

Liu, G., Gao, K., Ni, G., & Liu, X. (2015). Analysis on morphological and structural features of graphene layers by using polarization indirect microscopic imaging system. 在 P. Cheben, Z. Zhou, & C. Zhou (编辑), 2015 International Conference on Optical Instruments and Technology: Micro/Nano Photonics and Fabrication, OIT 2015 文章 96240I (Proceedings of SPIE - The International Society for Optical Engineering; 卷 9624). SPIE. https://doi.org/10.1117/12.2195263

Liu, Guoyan ; Gao, Kun ; Ni, Guoqiang 等. / Analysis on morphological and structural features of graphene layers by using polarization indirect microscopic imaging system. 2015 International Conference on Optical Instruments and Technology: Micro/Nano Photonics and Fabrication, OIT 2015. 编辑 / Pavel Cheben ; Zhiping Zhou ; Changhe Zhou. SPIE, 2015. (Proceedings of SPIE - The International Society for Optical Engineering).

@inproceedings{d2ec843b4565407fa3d019080dd2e50e,

title = "Analysis on morphological and structural features of graphene layers by using polarization indirect microscopic imaging system",

abstract = "Simple polarization indirect microscopic imaging can visualize graphene layer's dimensions features, however, its limited resolution makes it impossible to analyze the other physical characteristics. Our research uses polarization parameter indirect microscopic imaging system with super-resolution to modulate the variation of far field point spread function with varying polarization status and improve wavefront aberration, sensor error, and polarization angle. This method has much higher sensitivity to graphene overlapping layers, edges, wrinkles and grain boundaries. Finally, this technique for graphene inspection that is capable of reaching super-resolution.",

keywords = "Indirect imaging, graphene layers, super resolution",

author = "Guoyan Liu and Kun Gao and Guoqiang Ni and Xuefeng Liu",

note = "Publisher Copyright: {\textcopyright} 2015 SPIE.; 2015 International Conference on Optical Instruments and Technology: Micro/Nano Photonics and Fabrication, OIT 2015 ; Conference date: 17-05-2015 Through 19-05-2015",

year = "2015",

doi = "10.1117/12.2195263",

language = "English",

series = "Proceedings of SPIE - The International Society for Optical Engineering",

publisher = "SPIE",

editor = "Pavel Cheben and Zhiping Zhou and Changhe Zhou",

booktitle = "2015 International Conference on Optical Instruments and Technology",

address = "United States",

}

Liu, G, Gao, K, Ni, G & Liu, X 2015, Analysis on morphological and structural features of graphene layers by using polarization indirect microscopic imaging system. 在 P Cheben, Z Zhou & C Zhou (编辑), 2015 International Conference on Optical Instruments and Technology: Micro/Nano Photonics and Fabrication, OIT 2015., 96240I, Proceedings of SPIE - The International Society for Optical Engineering, 卷 9624, SPIE, 2015 International Conference on Optical Instruments and Technology: Micro/Nano Photonics and Fabrication, OIT 2015, Beijing, 中国, 17/05/15. https://doi.org/10.1117/12.2195263

Analysis on morphological and structural features of graphene layers by using polarization indirect microscopic imaging system. / Liu, Guoyan; Gao, Kun; Ni, Guoqiang 等.
2015 International Conference on Optical Instruments and Technology: Micro/Nano Photonics and Fabrication, OIT 2015. 编辑 / Pavel Cheben; Zhiping Zhou; Changhe Zhou. SPIE, 2015. 96240I (Proceedings of SPIE - The International Society for Optical Engineering; 卷 9624).

科研成果: 书/报告/会议事项章节 › 会议稿件 › 同行评审

TY - GEN

T1 - Analysis on morphological and structural features of graphene layers by using polarization indirect microscopic imaging system

AU - Liu, Guoyan

AU - Gao, Kun

AU - Ni, Guoqiang

AU - Liu, Xuefeng

PY - 2015

Y1 - 2015

N2 - Simple polarization indirect microscopic imaging can visualize graphene layer's dimensions features, however, its limited resolution makes it impossible to analyze the other physical characteristics. Our research uses polarization parameter indirect microscopic imaging system with super-resolution to modulate the variation of far field point spread function with varying polarization status and improve wavefront aberration, sensor error, and polarization angle. This method has much higher sensitivity to graphene overlapping layers, edges, wrinkles and grain boundaries. Finally, this technique for graphene inspection that is capable of reaching super-resolution.

AB - Simple polarization indirect microscopic imaging can visualize graphene layer's dimensions features, however, its limited resolution makes it impossible to analyze the other physical characteristics. Our research uses polarization parameter indirect microscopic imaging system with super-resolution to modulate the variation of far field point spread function with varying polarization status and improve wavefront aberration, sensor error, and polarization angle. This method has much higher sensitivity to graphene overlapping layers, edges, wrinkles and grain boundaries. Finally, this technique for graphene inspection that is capable of reaching super-resolution.

KW - Indirect imaging

KW - graphene layers

KW - super resolution

UR - http://www.scopus.com/inward/record.url?scp=84943382273&partnerID=8YFLogxK

U2 - 10.1117/12.2195263

DO - 10.1117/12.2195263

M3 - Conference contribution

AN - SCOPUS:84943382273

T3 - Proceedings of SPIE - The International Society for Optical Engineering

BT - 2015 International Conference on Optical Instruments and Technology

A2 - Cheben, Pavel

A2 - Zhou, Zhiping

A2 - Zhou, Changhe

PB - SPIE

T2 - 2015 International Conference on Optical Instruments and Technology: Micro/Nano Photonics and Fabrication, OIT 2015

Y2 - 17 May 2015 through 19 May 2015

ER -

Liu G, Gao K, Ni G, Liu X. Analysis on morphological and structural features of graphene layers by using polarization indirect microscopic imaging system. 在 Cheben P, Zhou Z, Zhou C, 编辑, 2015 International Conference on Optical Instruments and Technology: Micro/Nano Photonics and Fabrication, OIT 2015. SPIE. 2015. 96240I. (Proceedings of SPIE - The International Society for Optical Engineering). doi: 10.1117/12.2195263

Analysis on morphological and structural features of graphene layers by using polarization indirect microscopic imaging system

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