Analysis of imaging quality under the systematic parameters for thermal imaging system

Bin Liu*, Weiqi Jin

*此作品的通讯作者

科研成果: 书/报告/会议事项章节会议稿件同行评审

1 引用 (Scopus)

摘要

The integration of thermal imaging system and radar system could increase the range of target identification as well as strengthen the accuracy and reliability of detection, which is a state-of-the-art and mainstream integrated system to search any invasive target and guard homeland security. When it works, there is, however, one defect existing of what the thermal imaging system would produce affected images which could cause serious consequences when searching and detecting. In this paper, we study and reveal the reason why and how the affected images would occur utilizing the principle of lightwave before establishing mathematical imaging model which could meet the course of ray transmitting. In the further analysis, we give special attentions to the systematic parameters of the model, and analyse in detail all parameters which could possibly affect the imaging process and the function how it does respectively. With comprehensive research, we obtain detailed information about the regulation of diffractive phenomena shaped by these parameters. Analytical results have been convinced through the comparison between experimental images and MATLAB simulated images, while simulated images based on the parameters we revised to judge our expectation have good comparability with images acquired in reality.

源语言英语
主期刊名International Symposium on Photoelectronic Detection and Imaging 2009 - Advances in Infrared Imaging and Applications
DOI
出版状态已出版 - 2009
活动International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Infrared Imaging and Applications - Beijing, 中国
期限: 17 6月 200919 6月 2009

出版系列

姓名Proceedings of SPIE - The International Society for Optical Engineering
7383
ISSN(印刷版)0277-786X

会议

会议International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Infrared Imaging and Applications
国家/地区中国
Beijing
时期17/06/0919/06/09

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引用此

Liu, B., & Jin, W. (2009). Analysis of imaging quality under the systematic parameters for thermal imaging system. 在 International Symposium on Photoelectronic Detection and Imaging 2009 - Advances in Infrared Imaging and Applications 文章 73832V (Proceedings of SPIE - The International Society for Optical Engineering; 卷 7383). https://doi.org/10.1117/12.834726