Analysis and Scheduling for Flexible Job Shop Problem based on Unreliable Degraded Machine Model and Finite Buffers

Panpan Shangguan, Zhiyang Jia, Lengandong Shi, Sijie Yin, Minghao Duan, Jianchao Zhang

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

In recent decades, the Flexible Job Shop Scheduling Problem (FJSP) has been widely studied. From a theoretical perspective, the FJSP with a fixed number of jobs has attracted significant attention. In actual production environments, machine performance can fluctuate due to factors such as workload and maintenance status, and machine performance does not remain constant but changes with the processing of workpieces. Therefore, it is necessary to study a FJSP model based on unreliable degraded machines and finite buffers. In this paper, a model of unreliable degraded machine is established, and the processing time of workpieces on degraded machines is calculated based on this model. Using the accurate processing times, an improved genetic algorithm is employed to solve the scheduling problem in flexible job shop production. The effectiveness of the algorithm is verified through numerical experiments.

源语言英语
主期刊名Proceedings - 2024 China Automation Congress, CAC 2024
出版商Institute of Electrical and Electronics Engineers Inc.
2926-2931
页数6
ISBN(电子版)9798350368604
DOI
出版状态已出版 - 2024
活动2024 China Automation Congress, CAC 2024 - Qingdao, 中国
期限: 1 11月 20243 11月 2024

出版系列

姓名Proceedings - 2024 China Automation Congress, CAC 2024

会议

会议2024 China Automation Congress, CAC 2024
国家/地区中国
Qingdao
时期1/11/243/11/24

指纹

探究 'Analysis and Scheduling for Flexible Job Shop Problem based on Unreliable Degraded Machine Model and Finite Buffers' 的科研主题。它们共同构成独一无二的指纹。

引用此

Shangguan, P., Jia, Z., Shi, L., Yin, S., Duan, M., & Zhang, J. (2024). Analysis and Scheduling for Flexible Job Shop Problem based on Unreliable Degraded Machine Model and Finite Buffers. 在 Proceedings - 2024 China Automation Congress, CAC 2024 (页码 2926-2931). (Proceedings - 2024 China Automation Congress, CAC 2024). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/CAC63892.2024.10865089