An auto-test system based on VEE for the improvemet of target positionprecision

Ming Wei, Ning Chen, Ju Zhou, Jingchao Du

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

The influence of amplitude and phase errors on precision of target position is analyzed. To reduce amplitude and phase errors, iterative algorithm is applied in calibration. In this algorithm, amplitude and phase characteristics of all microwave components need to be tested. In this paper, an auto-test system developed in VEE and based on GPIB serial bus technology is introduced. Compared with the traditional manual testing method, the anto-test system improves efficiency and accuracy on the test of digital attenuator and phase shifter with high resolution.

源语言英语
主期刊名Advances in Mechanics Engineering
953-956
页数4
DOI
出版状态已出版 - 2012
活动2012 International Conference on Advances in Mechanics Engineering, ICAME 2012 - , 香港
期限: 3 8月 20125 8月 2012

出版系列

姓名Advanced Materials Research
588-589
ISSN(印刷版)1022-6680

会议

会议2012 International Conference on Advances in Mechanics Engineering, ICAME 2012
国家/地区香港
时期3/08/125/08/12

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