An analytical dislocation multiple-pile-up model for the yield stress of fully lamellar TiAl alloys

An analytical dislocation multiple-pile-up model for yield stress of fully lamellar TiAl alloys was proposed. Numerical simulations showed that even when the grain size was fixed, different distributions of lamella sizes of different thickness influenced the yield stress. The proposed model agrees with the experimental results for fully lamellar TiAl alloys for relatively large lamellar thickness.