Activation of p-GaN in a two-step rapid thermal annealing process

Zhinong Yu*, Yanfei Gao, Jong Wook Seo

*此作品的通讯作者

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

A two-step rapid thermal annealing process was optimized to activate magnesium doped gallium nitride layer (P-GaN). The optimized process consists of a long-term step (4 min) at 600°C followed by a short-term step at 850°C for 1 min. A hole concentration of 1.40 × 1018 cm-3and a resistivity as low as 0.16 Ω-cm were achieved for the activated sample. The specific contact resistance for Ni/Au-contacted p-GaN and the turn-on voltage of GaN-based LEDs was determined to be 1.0 × 10 -4 Ω · cm2 and less than 3.2 V at 20 mA, which are improved results from those achieved by standard annealing process (750°C for 20 min).

源语言英语
主期刊名AD'07 - Proceedings of Asia Display 2007
1577-1581
页数5
出版状态已出版 - 2007
活动Asia Display 2007, AD'07 - Shanghai, 中国
期限: 12 3月 200716 3月 2007

出版系列

姓名AD'07 - Proceedings of Asia Display 2007
2

会议

会议Asia Display 2007, AD'07
国家/地区中国
Shanghai
时期12/03/0716/03/07

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引用此

Yu, Z., Gao, Y., & Seo, J. W. (2007). Activation of p-GaN in a two-step rapid thermal annealing process. 在 AD'07 - Proceedings of Asia Display 2007 (页码 1577-1581). (AD'07 - Proceedings of Asia Display 2007; 卷 2).