A novel technology-matching-based method for detecting edges of micro accessories

Weiren Wu, Li Jiang*, Zhijing Zhang, Xin Jin

*此作品的通讯作者

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

In order to improve the accuracy of measurement result when using visual inspection method measure the micro parts, the technology matching principle was promoted. It was pointed that optical characteristics of micro image had a relationship with the machining method of the micro parts, the edge detection method should be carried on according to its machining process when detecting the micro parts. A new edge detecting algorithm based on technology matching was proposed. The new method built the polynomial regression mathematics model of transition region image, and the accurate position was defined by mathematical derivation. The processing condition and statistics were added in the algorithm. In this foundation, evaluation model of edge image based on fractal theory in microscope measurement was proposed. Computing the fractal d imension of micro-machining images and analyzing the similarity of same micro -machining model, the new method for edge detection of micro accessory is universally applicable. Experimental results of four common micro-machining models shows the edge detection algorithm based on technology matching principle can accurately extract edge point, and the edge detection result can reach the inferior pixel level.

源语言英语
主期刊名10th International Symposium on Measurement and Quality Control 2010, ISMQC 2010
477-480
页数4
出版状态已出版 - 2010
活动10th International Symposium on Measurement and Quality Control 2010, ISMQC 2010 - Osaka, 日本
期限: 5 9月 20109 9月 2010

出版系列

姓名10th International Symposium on Measurement and Quality Control 2010, ISMQC 2010

会议

会议10th International Symposium on Measurement and Quality Control 2010, ISMQC 2010
国家/地区日本
Osaka
时期5/09/109/09/10

指纹

探究 'A novel technology-matching-based method for detecting edges of micro accessories' 的科研主题。它们共同构成独一无二的指纹。

引用此