A novel profile error model to calculate contact error

Qin Liu, Wei Ren Wu, Zhi Jing Zhang*, Xin Jin

*此作品的通讯作者

科研成果: 期刊稿件文章同行评审

1 引用 (Scopus)

摘要

A new profile model based on multi-scale asperities is developed and contact error is calculated. After stratified sampling, the model can get the distribution law of entity points on each cross section. Asperity radius of curvature is estimated by the relationship between circle radius and the section interval. Contact error is related to surface form error. A model equation of contact error plane is calculated through a method based on static equilibrium theory. Three contact asperities which determine the contact error plane on the rough surface are studied. The simulation results show that contact error can be accurately calculated according to the profile error model.

源语言英语
页(从-至)318-324
页数7
期刊Journal of Beijing Institute of Technology (English Edition)
23
3
出版状态已出版 - 1 9月 2014

指纹

探究 'A novel profile error model to calculate contact error' 的科研主题。它们共同构成独一无二的指纹。

引用此