TY - JOUR
T1 - A novel method of image gaussian noise filtering based on series connected PCNN model
AU - Jinping, He
AU - Kun, Gao
AU - Guoqiang, Ni
PY - 2009
Y1 - 2009
N2 - In this paper, a new image de-noising algorithm based on series connected pulse-coupled neural networks (PCNN) model is presented. Traditional PCNN is a single layer model, which is suitable for real-time image processing. In this article, a new improved PCNN model called the 'series connected PCNN' is proposed, and the traditional PCNN model has been rationally simplified. The simplified 'series connected PCNN' model has less iterative times, and it's more sensitive to image edges than the traditional model. The experimental results show that the new algorithm is very effective and provides better performance in protecting image edges compared with the median filter.
AB - In this paper, a new image de-noising algorithm based on series connected pulse-coupled neural networks (PCNN) model is presented. Traditional PCNN is a single layer model, which is suitable for real-time image processing. In this article, a new improved PCNN model called the 'series connected PCNN' is proposed, and the traditional PCNN model has been rationally simplified. The simplified 'series connected PCNN' model has less iterative times, and it's more sensitive to image edges than the traditional model. The experimental results show that the new algorithm is very effective and provides better performance in protecting image edges compared with the median filter.
KW - Image de-noise; gauss noise filter
KW - Pulse Coupled Neural Networks (PCNN)
KW - The series connected PCNN
KW - The single threshold PCNN
UR - http://www.scopus.com/inward/record.url?scp=62649159024&partnerID=8YFLogxK
U2 - 10.1117/12.805707
DO - 10.1117/12.805707
M3 - Conference article
AN - SCOPUS:62649159024
SN - 0277-786X
VL - 7156
JO - Proceedings of SPIE - The International Society for Optical Engineering
JF - Proceedings of SPIE - The International Society for Optical Engineering
M1 - 71561I
T2 - 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments
Y2 - 16 November 2008 through 19 November 2008
ER -