TY - GEN
T1 - A new method for code similarity detection
AU - Huang, Liuliu
AU - Shi, Shumin
AU - Huang, Heyan
PY - 2010
Y1 - 2010
N2 - Source code documents are vulnerable to being plagiarized. As the central component of Code Plagiarism Detection (CPD), Code Similarity Detection (CSD) attracts more and more attention. In this paper, we proposed a new method for CSD by combining structure metric with semantic computing techniques. It is capable of identifying not only the primary cheating means in code copy, but also the senior ones, such as replacing control structures with equivalent structures. We describe the design and implementation of the method, and make some comparative experiments against MOSS and the structure only method. Experiments show that the method proposed in this paper can obtain more effective similar values of code-pairs.
AB - Source code documents are vulnerable to being plagiarized. As the central component of Code Plagiarism Detection (CPD), Code Similarity Detection (CSD) attracts more and more attention. In this paper, we proposed a new method for CSD by combining structure metric with semantic computing techniques. It is capable of identifying not only the primary cheating means in code copy, but also the senior ones, such as replacing control structures with equivalent structures. We describe the design and implementation of the method, and make some comparative experiments against MOSS and the structure only method. Experiments show that the method proposed in this paper can obtain more effective similar values of code-pairs.
KW - Cheating means
KW - Code plagiarism
KW - Code similarity detection
KW - Semantic computing
KW - Structure metric
UR - http://www.scopus.com/inward/record.url?scp=79951495620&partnerID=8YFLogxK
U2 - 10.1109/PIC.2010.5687856
DO - 10.1109/PIC.2010.5687856
M3 - Conference contribution
AN - SCOPUS:79951495620
SN - 9781424467860
T3 - Proceedings of the 2010 IEEE International Conference on Progress in Informatics and Computing, PIC 2010
SP - 1015
EP - 1018
BT - Proceedings of the 2010 IEEE International Conference on Progress in Informatics and Computing, PIC 2010
T2 - 2010 1st IEEE International Conference on Progress in Informatics and Computing, PIC 2010
Y2 - 10 December 2010 through 12 December 2010
ER -