A Method for Model Thickness Analysis in Pro/E Environment

Zhen Chai, Xu Zhang, Haoqi Wang, Yuyou Zhang

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

Wall thickness has a direct impact on the appearance, performance and cost of a part, wall thickness analysis is important (sometimes essential) to examine and improve the manufacturability of a part after the design is complete. The current method of wall thickness analysis in pro/Engineering environment is to establish equally spaced cross-sections in different directions, which is inefficient and can be error prone. This paper details a method to analysis wall thickness automatically, which includes format conversion (from prt to stl), octree decomposition and ray-tracing to obtain thickness values, color rendering according to thickness values, this method provides an overall intuitive display of the model and improves the thickness analysis efficiency.

源语言英语
主期刊名Proceedings - 2015 International Conference on Computer Science and Mechanical Automation, CSMA 2015
出版商Institute of Electrical and Electronics Engineers Inc.
349-353
页数5
ISBN(电子版)9781467391658
DOI
出版状态已出版 - 4 1月 2016
活动International Conference on Computer Science and Mechanical Automation, CSMA 2015 - Hangzhou, 中国
期限: 23 10月 201525 10月 2015

出版系列

姓名Proceedings - 2015 International Conference on Computer Science and Mechanical Automation, CSMA 2015

会议

会议International Conference on Computer Science and Mechanical Automation, CSMA 2015
国家/地区中国
Hangzhou
时期23/10/1525/10/15

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