A method for compensating the polarization aberration of projection optics in immersion lithography

Yue Jia, Yanqiu Li*, Lihui Liu, Chunying Han, Xiaolin Liu

*此作品的通讯作者

科研成果: 书/报告/会议事项章节会议稿件同行评审

6 引用 (Scopus)

摘要

As the numerical aperture (NA) of 193nm immersion lithography projection optics (PO) increasing, polarization aberration (PA) leads to image quality degradation seriously. PA induced by large incident angle of light, film coatings and intrinsic birefringence of lens materials cannot be ignored. An effective method for PA compensation is to adjust lens position in PO. However, this method is complicated. Therefore, in this paper, an easy and feasible PA compensation method is proposed: for ArF lithographic PO with hyper NA (NA=1.2), which is designed by our laboratory, the PA-induced critical dimension error (CDE) can be effectively reduced by optimizing illumination source partial coherent factor σout. In addition, the basic idea of our method to suppress pattern placement error (PE) is to adopt anti-reflection (AR) multi-layers MgF2/LaF3/MgF2 and calcium fluoride CaF2 of [111] crystal axes. Our simulation results reveal that the proposed method can effectively and quantificationally compensate large PA in the optics. In particular, our method suppresses the dynamic range of CDE from -12.7nm ∼ +4.3nm to -1.1nm ∼ +1.2nm, while keeping PE at an acceptable level.

源语言英语
主期刊名7th International Symposium on Advanced Optical Manufacturing and Testing Technologies
主期刊副标题Design Manufacturing, and Testing of Micro- and Nano-Optical Devices, and Systems
编辑A.G. Poleshchuk, Tianchun Ye, Song Hu
出版商SPIE
ISBN(电子版)9781628413588
DOI
出版状态已出版 - 2014
活动7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design Manufacturing, and Testing of Micro- and Nano-Optical Devices, and Systems, AOMATT 2014 - Harbin, 中国
期限: 26 4月 201429 4月 2014

出版系列

姓名Proceedings of SPIE - The International Society for Optical Engineering
9283
ISSN(印刷版)0277-786X
ISSN(电子版)1996-756X

会议

会议7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design Manufacturing, and Testing of Micro- and Nano-Optical Devices, and Systems, AOMATT 2014
国家/地区中国
Harbin
时期26/04/1429/04/14

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