A high-resolution technique for strain measurement using an extrinsic Fabry-Perot interferometer (EFPI) and a compensating EFPI

Yi Jiang*, Caijie Tang

*此作品的通讯作者

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摘要

A white-light interferometry-based high-resolution technique for strain measurement using an extrinsic Fabry-Perot interferometer (EFPI) and a compensating EFPI is demonstrated. The phase difference between the two white-light optical spectra is calculated by a Fourier- transform-based technique. From this phase difference, the difference in cavity length between the two EFPIs is calculated. This, in turn, is used to measure strain. A strain resolution of 8.27 × 10-3 νε is achieved.

源语言英语
文章编号065304
期刊Measurement Science and Technology
卷19
期6
DOI
出版状态已出版 - 1 6月 2008

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Jiang, Y., & Tang, C. (2008). A high-resolution technique for strain measurement using an extrinsic Fabry-Perot interferometer (EFPI) and a compensating EFPI. Measurement Science and Technology, 19(6), 文章 065304. https://doi.org/10.1088/0957-0233/19/6/065304