A General Line-Line Method for Dielectric Material Characterization Using Conductors with the Same Cross-Sectional Geometry

Xiue Bao*, Song Liu, Ilja Ocket, Juncheng Bao, Dominique Schreurs, Shengkang Zhang, Chunyue Cheng, Keming Feng, Bart Nauwelaers

*此作品的通讯作者

科研成果: 期刊稿件文章同行评审

14 引用 (Scopus)

摘要

This letter presents a general 'line-line' (LL) method for measuring dielectric material's permittivity using transmission lines. Like the previous LL methods, the proposed method needs a fully characterized transmission line as a reference. Different from previous methods, the reference line can be loaded with an arbitrary material and can be of an arbitrary length. The proposed method is validated with on-wafer dielectric fluid measurement up to 50 GHz, and measurement results of pure water agree well with literature values.

源语言英语
页(从-至)356-358
页数3
期刊IEEE Microwave and Wireless Components Letters
28
4
DOI
出版状态已出版 - 4月 2018
已对外发布

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