A dual reflective electrothermal MEMS micromirror for full circumferential scanning endoscopic imaging

Lei Wu*, Huikai Xie

*此作品的通讯作者

科研成果: 书/报告/会议事项章节会议稿件同行评审

4 引用 (Scopus)

摘要

This paper reports the design, fabrication and measurements of a dual-reflective, single-crystal silicon based micromirror that can perform full circumferential scanning (FCS) for endoscopic optical coherence tomography (EOCT). In the proposed FCS-EOCT probe, two optical fibers are used to deliver light beams to either surface of the micromirror, which can rotate ±45° (or 90°) and thus a 180° optical scanning is obtained from each mirror surface, resulting in full circumferential scans. A novel surface- and bulk-combined micromachining process based on SOI wafers is developed for fabricating the dual reflective micromirror. The single-crystal-silicon device layer of SOI wafers is used for mirror flatness, and Al is coated on both sides for high reflectivity. With one light beam delivered to each mirror surface, full 360° scans have been observed. Other measured data include the resonant frequency: 328Hz, radius of curvatures: 124 mm (front surface) and 127 mm (back surface), and the reflectances: 81.3% (front surface) and 79.0% (back surface).

源语言英语
主期刊名MEMS/MOEMS Components and Their Applications V. Special Focus Topics
主期刊副标题Transducers at the Micro-Nano Interface
DOI
出版状态已出版 - 2008
已对外发布
活动MEMS/MOEMS Components and Their Applications V. Special Focus Topics: Transducers at the Micro-Nano Interface - San Jose, CA, 美国
期限: 21 1月 200822 1月 2008

出版系列

姓名Proceedings of SPIE - The International Society for Optical Engineering
6885
ISSN(印刷版)0277-786X

会议

会议MEMS/MOEMS Components and Their Applications V. Special Focus Topics: Transducers at the Micro-Nano Interface
国家/地区美国
San Jose, CA
时期21/01/0822/01/08

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