A Combination of BIM and BEM for efficiently analyzing optical elements

Fang Sun*, Juan Liu, Guo Ting Zhang, Chuan Fei Hu, Xiaoxing Su

*此作品的通讯作者

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

We propose the revised boundary integral method (RBIM) that combines the boundary integral method (BIM) and the boundary element method (BEM) together. It is well known that the boundary integral equations are cast into matrix form for ease of computer implementation, and the points on the diagonal line of the matrix present the superposition of the observation and the source points. The points are called singularity points which can cause the big error bar. Thus, we consider replacing the BIM by the BEM at the diagonal line, comparing the numerical results by using the RBIM, the BIM, the BEM, and the analytical method, and find the error bar caused by the RBIM is smaller than that of the BIM. It indicates that the RBIM is not only faster than the BEM, but also it is preciser than BIM.

源语言英语
主期刊名International Symposium on Photoelectronic Detection and Imaging 2007
主期刊副标题Optoelectronic System Design, Manufacturing, and Testing
DOI
出版状态已出版 - 2008
已对外发布
活动International Symposium on Photoelectronic Detection and Imaging, ISPDI 2007: Optoelectronic System Design, Manufacturing, and Testings - Beijing, 中国
期限: 9 9月 200712 9月 2007

出版系列

姓名Proceedings of SPIE - The International Society for Optical Engineering
6624
ISSN(印刷版)0277-786X

会议

会议International Symposium on Photoelectronic Detection and Imaging, ISPDI 2007: Optoelectronic System Design, Manufacturing, and Testings
国家/地区中国
Beijing
时期9/09/0712/09/07

指纹

探究 'A Combination of BIM and BEM for efficiently analyzing optical elements' 的科研主题。它们共同构成独一无二的指纹。

引用此