摘要
Aiming at nondestructive detection of the surface morphology of objects, a method based on large-area thin-film transistor (TFT) arrays and poly(vinglidene) fluoride (PVDF) films was developed, which can cover a large area and different shapes while is also portable and highly accurate. This method applies the TFT array, which has been widely used in the semiconductor display field, to the sensor applications. The sensor combined with TFT arrays utilizes the principle of capacitive sensor to accurately detect the surface topography, which can accurately locate micron-level surface defects with a resolution of 50 μm.
投稿的翻译标题 | Nondestructive Detection of Surface Morphology Based on Large-Area TFT and PVDF Films |
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源语言 | 繁体中文 |
页(从-至) | 287-290 |
页数 | 4 |
期刊 | Dianzi Keji Daxue Xuebao/Journal of the University of Electronic Science and Technology of China |
卷 | 49 |
期 | 2 |
DOI | |
出版状态 | 已出版 - 30 3月 2020 |
已对外发布 | 是 |
关键词
- PVDF
- Sensor
- Surface topography
- TFT
指纹
探究 '基于大面积TFT和PVDF薄膜的表面形貌无损探测技术' 的科研主题。它们共同构成独一无二的指纹。引用此
Shang, F., Hu, X. R., Zhang, Q., Liu, S., & Xiang, Y. (2020). 基于大面积TFT和PVDF薄膜的表面形貌无损探测技术. Dianzi Keji Daxue Xuebao/Journal of the University of Electronic Science and Technology of China, 49(2), 287-290. https://doi.org/10.12178/1001-0548.2019220