Bai, X., Liu, M., He, C., Dong, L., Zhao, Y. & Liu, X., 2019, Applications of Machine Learning. Zelinski, M. E., Taha, T. M., Howe, J., Awwal, A. A. S. & Iftekharuddin, K. M. (编辑). SPIE, 111390B. (Proceedings of SPIE - The International Society for Optical Engineering; 卷 11139).
Zhang, X., Wang, H. & He, C., 2012, Optical Design and Testing V. 85572E. (Proceedings of SPIE - The International Society for Optical Engineering; 卷 8557).
He, C., Zou, G., Ren, J. & Lin, J., 2011, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems.SPIE, 820123. (Proceedings of SPIE - The International Society for Optical Engineering; 卷 8201).