XML in automatic test system

Yu Zhang*, Ai Hua Wang, Shu Juan Liang

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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Abstract

This paper illustrates the XML characteristics and its good performance in data exchange, mainly introduces its application in Automatic Test System,including data saving and retrieving, data exchange with Matlab and Relational Database.

Original languageEnglish
Title of host publicationProceedings - 2010 3rd International Congress on Image and Signal Processing, CISP 2010
Pages4489-4492
Number of pages4
DOIs
Publication statusPublished - 2010
Event2010 3rd International Congress on Image and Signal Processing, CISP 2010 - Yantai, China
Duration: 16 Oct 2010 → 18 Oct 2010

Publication series

NameProceedings - 2010 3rd International Congress on Image and Signal Processing, CISP 2010
Volume9

Conference

Conference2010 3rd International Congress on Image and Signal Processing, CISP 2010
Country/TerritoryChina
CityYantai
Period16/10/10 → 18/10/10

Keywords

  • ATS
  • Data exchange
  • RDB
  • XML

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Zhang, Y., Wang, A. H., & Liang, S. J. (2010). XML in automatic test system. In Proceedings - 2010 3rd International Congress on Image and Signal Processing, CISP 2010 (pp. 4489-4492). Article 5646773 (Proceedings - 2010 3rd International Congress on Image and Signal Processing, CISP 2010; Vol. 9). https://doi.org/10.1109/CISP.2010.5646773