Work-in-Progress: Maximizing Model Accuracy in Real-time and Iterative Machine Learning

Rui Han, Fan Zhang, Lydia Y. Chen, Jianfeng Zhan

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Citations (Scopus)

Abstract

As iterative machine learning (ML) (e.g. neural network based supervised learning and k-means clustering) becomes more ubiquitous in our daily life, it is becoming increasingly important to complete model training quickly to support real-time decision making, while still achieving high model accuracy (e.g. low prediction errors) that is critical for profits of ML tasks. Motivated by the observation that the small proportions of accuracy-critical input data can contribute to large parts of model accuracy in many iterative ML applications, this paper introduces a system middleware to maximize model accuracy by spending the limited time budget on the most accuracy-related input data. To achieve this, our approach employs a fast method to divide the input data into multiple parts of similar points and represents each part with an aggregated data point. Using these points, it quickly estimates the correlations between different parts and model accuracy, thus allowing ML tasks to process the most accuracy-related parts first. We incorporate our approach with two popular supervised and unsupervised ML algorithms on Spark and demonstrate its benefits in providing high model accuracy under short deadlines.

Original languageEnglish
Title of host publicationProceedings - 2017 IEEE Real-Time Systems Symposium, RTSS 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages351-353
Number of pages3
ISBN (Electronic)9781538614143
DOIs
Publication statusPublished - 2 Jul 2017
Externally publishedYes
Event38th IEEE Real-Time Systems Symposium, RTSS 2017 - Paris, France
Duration: 5 Oct 20178 Oct 2017

Publication series

NameProceedings - Real-Time Systems Symposium
Volume2018-January
ISSN (Print)1052-8725

Conference

Conference38th IEEE Real-Time Systems Symposium, RTSS 2017
Country/TerritoryFrance
CityParis
Period5/10/178/10/17

Keywords

  • Accuracy-aware-processing
  • Machine-learning

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