Vignetting correction for irfpa-based train axle temperature measurement system

Guangting Liu*, Dayuan Yan, Xiaoming Hu, Hao Zhang, Lei Zhu

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Using thermal infrared imaging to obtain the temperature distribution of the train wheel sets is a new and promising temperature measurement method. The accuracy and precision of the method are suffered from vignetting. In this paper, the vignetting coefficient function has been derived and imaging system calibration is introduced to compensate the measurement result error caused by the inconsistent of the optic center and the image center. The vignetting correction is implemented on the hardware platform based on FPGA. Experimental results demonstrate that vignetting correction enhance the accuracy of measurement system.

Original languageEnglish
Title of host publication2011 International Conference on Optical Instruments and Technology
Subtitle of host publicationOptoelectronic Imaging and Processing Technology
DOIs
Publication statusPublished - 2011
Event2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology - Beijing, China
Duration: 6 Nov 20119 Nov 2011

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8200
ISSN (Print)0277-786X

Conference

Conference2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology
Country/TerritoryChina
CityBeijing
Period6/11/119/11/11

Keywords

  • Axle temperature measurement
  • Imaging system calibration
  • Thermal imaging
  • Vignetting correction

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Liu, G., Yan, D., Hu, X., Zhang, H., & Zhu, L. (2011). Vignetting correction for irfpa-based train axle temperature measurement system. In 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology Article 820006 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 8200). https://doi.org/10.1117/12.904656