Two-way feature-aligned and attention-rectified adversarial training

Haitao Zhang, Fan Jia, Quanxin Zhang, Yahong Han, Xiaohui Kuang, Yu An Tan

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Citations (Scopus)

Abstract

Adversarial training increases robustness by augmenting training data with adversarial examples. However, vanilla adversarial training may be overfitting to certain adversarial attacks. Small perturbations in images bring in error which is gradually amplified when forwarded through the model so that the error leads to wrong classification. Besides, small perturbations will also distract classifier's attention to significant features that are relevant to the true label. In this paper, we propose a novel two-way feature-aligned and attention-rectified adversarial training (FAAR) to improve adversarial training (AT). FAAR utilizes two-way feature alignment and attention rectification to mitigate the problems mentioned above. FAAR effectively suppresses perturbations in lowlevel, high-level and global features by moving features of perturbed images towards those of clean images with twoway feature alignment. It also leads the model into focusing more on useful features which are correlated with true label through rectifying gradient-weighted attention. Besides, feature alignment activates attention rectification by reducing perturbations in high-level feature. Our proposed method FAAR surpasses other existing AT methods in three aspects. First, it pushes the model to keep invariant when dealing with different adversarial attacks and different magnitude of perturbations. Second, it can be applied to any convolution neural networks. Third, the training process is end-to-end. For experiments, FAAR shows promising defense performance on CIFAR-10 and ImageNet.

Original languageEnglish
Title of host publication2020 IEEE International Conference on Multimedia and Expo, ICME 2020
PublisherIEEE Computer Society
ISBN (Electronic)9781728113319
DOIs
Publication statusPublished - Jul 2020
Event2020 IEEE International Conference on Multimedia and Expo, ICME 2020 - London, United Kingdom
Duration: 6 Jul 202010 Jul 2020

Publication series

NameProceedings - IEEE International Conference on Multimedia and Expo
Volume2020-July
ISSN (Print)1945-7871
ISSN (Electronic)1945-788X

Conference

Conference2020 IEEE International Conference on Multimedia and Expo, ICME 2020
Country/TerritoryUnited Kingdom
CityLondon
Period6/07/2010/07/20

Keywords

  • Adversarial training
  • Attention rectification
  • Feature alignment

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