@inproceedings{cb677a1b01634cc9b1667331c5e3fcd3,
title = "Topological darkness revisited: A four-dimensional picture",
abstract = "We present a complete description of 'topological darkness' in a four-dimensional space regarding optical constants (i.e. n and k) of effective media, wavelengths and incident angles, which is essential for enhanced light-matter interaction in thin-films.",
keywords = "Absorption, Dispersion, Optical films, Optical interferometry, Optical reflection, Three-dimensional displays",
author = "Haomin Song and Xie Zeng and Dengxin Ji and Nan Zhang and Kai Liu and Qiaoqiang Gan",
note = "Publisher Copyright: {\textcopyright} 2015 OSA.; Conference on Lasers and Electro-Optics, CLEO 2015 ; Conference date: 10-05-2015 Through 15-05-2015",
year = "2015",
month = aug,
day = "10",
language = "English",
series = "Conference on Lasers and Electro-Optics Europe - Technical Digest",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2015 Conference on Lasers and Electro-Optics, CLEO 2015",
address = "United States",
}