Tire X-ray image impurity detection based on multiple kernel learning

Shuai Zhao, Zhineng Chen*, Baokui Li, Bin Zhang

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Impurity detection on tire X-ray image is an indispensable phase in tire quality control and the widely adopted manual inspection could not attain satisfactory performance. In this work we propose an idMKL method to automatically detect impurities by leveraging multiple kernel learning (MKL). idMKL first applies image processing techniques to separate different regions of a tire image and suppress their normal texture characteristics. As a result, candidate blobs containing both true impurities and false alarms are obtained. We extract different features from the blobs and evaluate their effectiveness in impurity detection. MKL is then employed to adaptively combine the features to maximize the detection performance. Experiments on thousands of images show that idMKL can well separate the blobs and achieves promising results in tire impurity detection. Moreover, idMKL has been adopted as a mean complementary to the manual inspection by tire factories and shown to be effective.

Original languageEnglish
Title of host publicationAdvances in Multimedia Information Processing – PCM 2017 - 18th Pacific-Rim Conference on Multimedia, Revised Selected Papers
EditorsBing Zeng, Hongliang Li, Abdulmotaleb El Saddik, Xiaopeng Fan, Shuqiang Jiang, Qingming Huang
PublisherSpringer Verlag
Pages346-355
Number of pages10
ISBN (Print)9783319773797
DOIs
Publication statusPublished - 2018
Event18th Pacific-Rim Conference on Multimedia, PCM 2017 - Harbin, China
Duration: 28 Sept 201729 Sept 2017

Publication series

NameLecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
Volume10735 LNCS
ISSN (Print)0302-9743
ISSN (Electronic)1611-3349

Conference

Conference18th Pacific-Rim Conference on Multimedia, PCM 2017
Country/TerritoryChina
CityHarbin
Period28/09/1729/09/17

Keywords

  • Defect detection
  • Multiple kernel learning
  • Tire X-ray image

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