Thick Layered Semiconductor Devices with Water Top-Gates: High On-Off Ratio Field-Effect Transistors and Aqueous Sensors

Yuan Huang, Eli Sutter, Liang Mei Wu, Hong Xu, Lihong Bao, Hong Jun Gao, Xing Jiang Zhou, Peter Sutter*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

18 Citations (Scopus)

Abstract

Layered semiconductors show promise as channel materials for field-effect transistors (FETs). Usually, such devices incorporate solid back or top gate dielectrics. Here, we explore deionized (DI) water as a solution top-gate for field-effect switching of layered semiconductors including SnS2, MoS2, and black phosphorus. The DI water gate is easily fabricated, can sustain rapid bias changes, and its efficient coupling to layered materials provides high on-off current ratios, near-ideal subthreshold swing, and enhanced short-channel behavior even for FETs with thick, bulk-like channels, where such control is difficult to realize with conventional back gating. Screening by the high-k solution gate eliminates hysteresis due to surface and interface trap states and substantially enhances the field-effect mobility. The onset of water electrolysis sets the ultimate limit to DI water gating at large negative gate bias. Measurements in this regime show promise for aqueous sensing, demonstrated here by the amperometric detection of glucose in aqueous solution. DI water gating of layered semiconductors can be harnessed in research on novel materials and devices, and it may with further development find broad applications in microelectronics and sensing.

Original languageEnglish
Pages (from-to)23198-23207
Number of pages10
JournalACS applied materials & interfaces
Volume10
Issue number27
DOIs
Publication statusPublished - 11 Jul 2018
Externally publishedYes

Keywords

  • black phosphorus
  • field-effect transistor
  • layered semiconductors
  • molybdenum disulfide
  • tin disulfide

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