TY - GEN
T1 - The study of mechanical characteristic of electrodeposited nanocrystalline Ni-Co alloy
AU - Xu, Chengdong
AU - Xu, Yunhua
AU - Gong, Xiaojing
PY - 2010
Y1 - 2010
N2 - The electrodeposited nanocrystalline by nano-plating technology is used in electronic components and have more excellent properties in tribological property and service life. In this paper the electrodeposited nanocrystalline of Ni-Co alloy nano-plating technology is introduced and the influence of pulse frequency on micro-hardness, internal stress and micromorphology of high frequency pulse electroplating Ni-Co composite coating is studied. The results show that as the frequency increased, the surface of the plating tended to be more compact and internal stress of the plating is lower. As surfactant, sodium allylsulfonate, saccharin sodium and thiourea improve the micro-hardness evidently and thiourea is the best one of them, reached 526HV.
AB - The electrodeposited nanocrystalline by nano-plating technology is used in electronic components and have more excellent properties in tribological property and service life. In this paper the electrodeposited nanocrystalline of Ni-Co alloy nano-plating technology is introduced and the influence of pulse frequency on micro-hardness, internal stress and micromorphology of high frequency pulse electroplating Ni-Co composite coating is studied. The results show that as the frequency increased, the surface of the plating tended to be more compact and internal stress of the plating is lower. As surfactant, sodium allylsulfonate, saccharin sodium and thiourea improve the micro-hardness evidently and thiourea is the best one of them, reached 526HV.
UR - http://www.scopus.com/inward/record.url?scp=77951653499&partnerID=8YFLogxK
U2 - 10.1109/INEC.2010.5425031
DO - 10.1109/INEC.2010.5425031
M3 - Conference contribution
AN - SCOPUS:77951653499
SN - 9781424435449
T3 - INEC 2010 - 2010 3rd International Nanoelectronics Conference, Proceedings
SP - 1072
EP - 1073
BT - INEC 2010 - 2010 3rd International Nanoelectronics Conference, Proceedings
T2 - 2010 3rd International Nanoelectronics Conference, INEC 2010
Y2 - 3 January 2010 through 8 January 2010
ER -