Abstract
In order to overcome the problem of low spatial resolution in ordinary optical microscopy, microscopic indirect imaging with super resolution is introduced. This article elaborates three aspects of the status and trends of indirect imaging system: first, the theories in variable optical coupling transmission and the super resolution metrology; second, metrology method and model of multidimensional optical wave vector parameter; third, the theory in super resolution indirect vectorial parameter imaging by modulation and compensative imaging of multi-spatial dimensions and physical parameters.
| Original language | English |
|---|---|
| Title of host publication | International Conference on Photonics and Optical Engineering, icPOE 2014 |
| Editors | Weiguo Liu, Anand Asundi, Chunmin Zhang, Ailing Tian |
| Publisher | SPIE |
| ISBN (Electronic) | 9781628415650 |
| DOIs | |
| Publication status | Published - 2015 |
| Event | International Conference on Photonics and Optical Engineering, icPOE 2014 - Xi'an, China Duration: 13 Oct 2014 → 15 Oct 2014 |
Publication series
| Name | Proceedings of SPIE - The International Society for Optical Engineering |
|---|---|
| Volume | 9449 |
| ISSN (Print) | 0277-786X |
| ISSN (Electronic) | 1996-756X |
Conference
| Conference | International Conference on Photonics and Optical Engineering, icPOE 2014 |
|---|---|
| Country/Territory | China |
| City | Xi'an |
| Period | 13/10/14 → 15/10/14 |
Keywords
- diffraction limit
- indirect imaging
- super resolution
Cite this
Liu, G., Gao, K., & Ni, G. (2015). The status and trends of microscopic indirect imaging system with super resolution. In W. Liu, A. Asundi, C. Zhang, & A. Tian (Eds.), International Conference on Photonics and Optical Engineering, icPOE 2014 Article 94492K (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9449). SPIE. https://doi.org/10.1117/12.2083176