The measurement error analysis of load pull system of high frequency and the novel measure method

Zhensheng Wang; Weibin Zheng; Weibo Wang; Hongqi Tao; Feng Qian; Bo Xu

The measurement error analysis of load pull system of high frequency and the novel measure method

Zhensheng Wang^*, Weibin Zheng, Weibo Wang, Hongqi Tao, Feng Qian, Bo Xu

^*Corresponding author for this work

Nanjing Electronic Devices Institute

Research output: Contribution to journal › Article › peer-review

Abstract

Load pull systems are complex microwave measurement systems which have different setup and test error in accordance to the measurement frequency band. From the inherent characteristics of load pull systems and the tested devices, the origination of the high-frequency test error was analyzed, and a novel measure method was presented for the improvement of the high-frequency test precision by load pull system.

Original language	English
Pages (from-to)	312-317
Number of pages	6
Journal	Guti Dianzixue Yanjiu Yu Jinzhan/Research and Progress of Solid State Electronics
Volume	36
Issue number	4
Publication status	Published - 25 Aug 2016
Externally published	Yes

Keywords

High frequency load pull on wafer
Load pull
Millimeter microwave load pull

Cite this

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title = "The measurement error analysis of load pull system of high frequency and the novel measure method",

abstract = "Load pull systems are complex microwave measurement systems which have different setup and test error in accordance to the measurement frequency band. From the inherent characteristics of load pull systems and the tested devices, the origination of the high-frequency test error was analyzed, and a novel measure method was presented for the improvement of the high-frequency test precision by load pull system.",

keywords = "High frequency load pull on wafer, Load pull, Millimeter microwave load pull",

author = "Zhensheng Wang and Weibin Zheng and Weibo Wang and Hongqi Tao and Feng Qian and Bo Xu",

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T1 - The measurement error analysis of load pull system of high frequency and the novel measure method

AU - Wang, Zhensheng

AU - Zheng, Weibin

AU - Wang, Weibo

AU - Tao, Hongqi

AU - Qian, Feng

AU - Xu, Bo

PY - 2016/8/25

Y1 - 2016/8/25

N2 - Load pull systems are complex microwave measurement systems which have different setup and test error in accordance to the measurement frequency band. From the inherent characteristics of load pull systems and the tested devices, the origination of the high-frequency test error was analyzed, and a novel measure method was presented for the improvement of the high-frequency test precision by load pull system.

AB - Load pull systems are complex microwave measurement systems which have different setup and test error in accordance to the measurement frequency band. From the inherent characteristics of load pull systems and the tested devices, the origination of the high-frequency test error was analyzed, and a novel measure method was presented for the improvement of the high-frequency test precision by load pull system.

KW - High frequency load pull on wafer

KW - Load pull

KW - Millimeter microwave load pull

UR - http://www.scopus.com/inward/record.url?scp=85001084866&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:85001084866

SN - 1000-3819

VL - 36

SP - 312

EP - 317

JO - Guti Dianzixue Yanjiu Yu Jinzhan/Research and Progress of Solid State Electronics

JF - Guti Dianzixue Yanjiu Yu Jinzhan/Research and Progress of Solid State Electronics

IS - 4

ER -

The measurement error analysis of load pull system of high frequency and the novel measure method

Abstract

Keywords

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