TY - GEN
T1 - The influence of the measurement probe in nearfield measure
AU - Cao, Meng
AU - Xue, Zhenghui
AU - Zhu, Ruoqing
AU - Cai, Hongwei
AU - Pei, Zhen
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2016/11/28
Y1 - 2016/11/28
N2 - Multiple reflection signals between the probe and the antenna is neglected on frequency domain near field tests, which can be reduced by technique such as timegate in the time domain near field test sometimes. In this letter multiple reflection signals is studied by analyze the signals in the port of antenna under test (AUT). The multiple reflection signals with different probe in different position are shown, and then influence of each parameter of probe is presented.
AB - Multiple reflection signals between the probe and the antenna is neglected on frequency domain near field tests, which can be reduced by technique such as timegate in the time domain near field test sometimes. In this letter multiple reflection signals is studied by analyze the signals in the port of antenna under test (AUT). The multiple reflection signals with different probe in different position are shown, and then influence of each parameter of probe is presented.
UR - http://www.scopus.com/inward/record.url?scp=85009808456&partnerID=8YFLogxK
U2 - 10.1109/ICMMT.2016.7761741
DO - 10.1109/ICMMT.2016.7761741
M3 - Conference contribution
AN - SCOPUS:85009808456
T3 - 9th International Conference on Microwave and Millimeter Wave Technology, ICMMT 2016 - Proceedings
SP - 257
EP - 260
BT - 9th International Conference on Microwave and Millimeter Wave Technology, ICMMT 2016 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 9th International Conference on Microwave and Millimeter Wave Technology, ICMMT 2016
Y2 - 5 June 2016 through 8 June 2016
ER -