Abstract
The dynamic behavior of two parallel symmetric cracks in functionally graded piezoelectric/piezomagnetic materials subjected to harmonic antiplane shear waves is investigated using the Schmidt method. The present problem can be solved using the Fourier transform and the technique of dual integral equations, in which the unknown variables are jumps of displacements across the crack surfaces, not dislocation density functions. To solve the dual integral equations, the jumps of displacements across the crack surfaces are directly expanded as a series of Jacobi polynomials. Finally, the relations among the electric, magnetic flux, and dynamic stress fields near crack tips can be obtained. Numerical examples are provided to show the effect of the functionally graded parameter, the distance between the two parallel cracks, and the circular frequency of the incident waves upon the stress, electric displacement, and magnetic flux intensity factors at crack tips.
| Original language | English |
|---|---|
| Pages (from-to) | 443-464 |
| Number of pages | 22 |
| Journal | Archive of Applied Mechanics |
| Volume | 78 |
| Issue number | 6 |
| DOIs | |
| Publication status | Published - Jun 2008 |
| Externally published | Yes |
Keywords
- Functionally graded piezoelectric/piezomagnetic materials
- Parallel cracks
- Stress wave