TY - GEN
T1 - Temporal high-pass non-uniformity correction algorithm based on grayscale mapping and hardware implementation
AU - Jin, Minglei
AU - Jin, Weiqi
AU - Li, Yiyang
AU - Li, Shuo
N1 - Publisher Copyright:
© 2015 SPIE.
PY - 2015
Y1 - 2015
N2 - In this paper, we propose a novel scene-based non-uniformity correction algorithm for infrared image processing-temporal high-pass non-uniformity correction algorithm based on grayscale mapping (THP and GM). The main sources of non-uniformity are: (1) detector fabrication inaccuracies; (2) non-linearity and variations in the read-out electronics and (3) optical path effects. The non-uniformity will be reduced by non-uniformity correction (NUC) algorithms. The NUC algorithms are often divided into calibration-based non-uniformity correction (CBNUC) algorithms and scene-based non-uniformity correction (SBNUC) algorithms. As non-uniformity drifts temporally, CBNUC algorithms must be repeated by inserting a uniform radiation source which SBNUC algorithms do not need into the view, so the SBNUC algorithm becomes an essential part of infrared imaging system. The SBNUC algorithms™ poor robustness often leads two defects: artifacts and over-correction, meanwhile due to complicated calculation process and large storage consumption, hardware implementation of the SBNUC algorithms is difficult, especially in Field Programmable Gate Array (FPGA) platform. The THP and GM algorithm proposed in this paper can eliminate the non-uniformity without causing defects. The hardware implementation of the algorithm only based on FPGA has two advantages: (1) low resources consumption, and (2) small hardware delay: less than 20 lines, it can be transplanted to a variety of infrared detectors equipped with FPGA image processing module, it can reduce the stripe non-uniformity and the ripple non-uniformity.
AB - In this paper, we propose a novel scene-based non-uniformity correction algorithm for infrared image processing-temporal high-pass non-uniformity correction algorithm based on grayscale mapping (THP and GM). The main sources of non-uniformity are: (1) detector fabrication inaccuracies; (2) non-linearity and variations in the read-out electronics and (3) optical path effects. The non-uniformity will be reduced by non-uniformity correction (NUC) algorithms. The NUC algorithms are often divided into calibration-based non-uniformity correction (CBNUC) algorithms and scene-based non-uniformity correction (SBNUC) algorithms. As non-uniformity drifts temporally, CBNUC algorithms must be repeated by inserting a uniform radiation source which SBNUC algorithms do not need into the view, so the SBNUC algorithm becomes an essential part of infrared imaging system. The SBNUC algorithms™ poor robustness often leads two defects: artifacts and over-correction, meanwhile due to complicated calculation process and large storage consumption, hardware implementation of the SBNUC algorithms is difficult, especially in Field Programmable Gate Array (FPGA) platform. The THP and GM algorithm proposed in this paper can eliminate the non-uniformity without causing defects. The hardware implementation of the algorithm only based on FPGA has two advantages: (1) low resources consumption, and (2) small hardware delay: less than 20 lines, it can be transplanted to a variety of infrared detectors equipped with FPGA image processing module, it can reduce the stripe non-uniformity and the ripple non-uniformity.
KW - FPGA
KW - infrared image processing
KW - low resources consumption
KW - scene-based non-uniformity correction
KW - small hardware delay
KW - temporal high-pass
UR - http://www.scopus.com/inward/record.url?scp=84943553333&partnerID=8YFLogxK
U2 - 10.1117/12.2191836
DO - 10.1117/12.2191836
M3 - Conference contribution
AN - SCOPUS:84943553333
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - 2015 International Conference on Optical Instruments and Technology
A2 - Shi, Guangming
A2 - Huang, Bormin
A2 - Li, Xuelong
PB - SPIE
T2 - 2015 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, OIT 2015
Y2 - 17 May 2015 through 19 May 2015
ER -