Surface-scattering-assisted Beam Scan for Terahertz Channel Alignment

Peian Li, Jianchen Wang, Wenbo Liu, Jianjun Ma*, Houjun Sun

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Wireless communication technology operating at terahertz frequencies has been proposed as a potential candidate to support high spectral efficiency and high-speed data transmission. The use of high-gain, highly directional antennas help to extend its link distance effectively by overcoming free space path losses. But this also leads to difficulties in channel alignment due to its extremely narrow beam-width and small divergence angle. Employing non-line-of-sight (NLoS) path components, generated by surface scattering effect, can be a potential solution for wide channel coverage and efficient beam management. In this work we propose a method for channel alignment by using multi-path scattering components from a metallic wavy surface for channel scan and alignment. We find that the period of the surface and the incident angle are responsible for the efficiency and precision in channel scanning.

Original languageEnglish
Title of host publication2023 International Conference on Microwave and Millimeter Wave Technology, ICMMT 2023 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798350338874
DOIs
Publication statusPublished - 2023
Event15th International Conference on Microwave and Millimeter Wave Technology, ICMMT 2023 - Qingdao, China
Duration: 14 May 202317 May 2023

Publication series

Name2023 International Conference on Microwave and Millimeter Wave Technology, ICMMT 2023 - Proceedings

Conference

Conference15th International Conference on Microwave and Millimeter Wave Technology, ICMMT 2023
Country/TerritoryChina
CityQingdao
Period14/05/2317/05/23

Fingerprint

Dive into the research topics of 'Surface-scattering-assisted Beam Scan for Terahertz Channel Alignment'. Together they form a unique fingerprint.

Cite this