TY - JOUR
T1 - Surface Effect of Thickness-Dependent Polarization and Domain Evolution in BiFeO3 Epitaxial Ultrathin Films
AU - Ren, Jing
AU - Tang, Shiyu
AU - Guo, Changqing
AU - Wang, Jing
AU - Huang, Houbing
N1 - Publisher Copyright:
© 2023 American Chemical Society.
PY - 2024/1/10
Y1 - 2024/1/10
N2 - With the trend of device miniaturization, ultrathin ferroelectric films are gaining more and more attention. However, understanding ferroelectricity in this nanoscale context remains a formidable challenge, primarily due to the heightened relevance of surface effects, which often leads to the loss of net polarization. Here, the influence of surface effects on the polarization as a function of thickness in ultrathin BiFeO3 films is investigated using phase-field simulations. The findings reveal a notable increase in ferroelectric polarization with increasing thickness, with a particularly discernible change occurring below the 10 nm threshold. Upon accounting for surface effects, the polarization is marginally lower than the case without such considerations, with the disparity becoming more pronounced at smaller thicknesses. Moreover, the hysteresis loop and butterfly loop of the ultrathin film were simulated, demonstrating that the ferroelectric properties of films remain robust even down to a thickness of 5 nm. Our investigations provide valuable insights into the significance of ferroelectric thin films in device miniaturization.
AB - With the trend of device miniaturization, ultrathin ferroelectric films are gaining more and more attention. However, understanding ferroelectricity in this nanoscale context remains a formidable challenge, primarily due to the heightened relevance of surface effects, which often leads to the loss of net polarization. Here, the influence of surface effects on the polarization as a function of thickness in ultrathin BiFeO3 films is investigated using phase-field simulations. The findings reveal a notable increase in ferroelectric polarization with increasing thickness, with a particularly discernible change occurring below the 10 nm threshold. Upon accounting for surface effects, the polarization is marginally lower than the case without such considerations, with the disparity becoming more pronounced at smaller thicknesses. Moreover, the hysteresis loop and butterfly loop of the ultrathin film were simulated, demonstrating that the ferroelectric properties of films remain robust even down to a thickness of 5 nm. Our investigations provide valuable insights into the significance of ferroelectric thin films in device miniaturization.
KW - ferroelectric domain structure
KW - ferroelectric thin film
KW - phase-field simulation
KW - surface effect
KW - thickness dependence
UR - http://www.scopus.com/inward/record.url?scp=85181833209&partnerID=8YFLogxK
U2 - 10.1021/acsami.3c14561
DO - 10.1021/acsami.3c14561
M3 - Article
C2 - 38149600
AN - SCOPUS:85181833209
SN - 1944-8244
VL - 16
SP - 1074
EP - 1081
JO - ACS applied materials & interfaces
JF - ACS applied materials & interfaces
IS - 1
ER -