Super-Resolution Network for X-Ray Security Inspection

Haoyuan Du*, Meng Fan, Liquan Dong

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

X-ray imaging is widely used in airports and transportation for security maintaining. Conventional x-ray images often suffer from noise interference, over sharpening or detail loss, especially in areas where multiple objects overlap each other. To overcome the shortcomings of traditional methods, this article presents a method to reveal the details based on convolutional neural network (CNN). We put forward a well-designed super resolution (SR) network exploiting selfguided architecture to fuse multi-scale information. At each scale, we adopt residual feature aggregation strategy for extracting representative details. We also find it is beneficial to establish links between high energy (HE) and low energy (LE) images, thus the restored images show more fine textures and better material resolution. The comparison experiments demonstrate that the proposed network outperforms traditional approaches for restoring details and suppressing noise effectively.

Original languageEnglish
Title of host publication2021 International Conference on Optical Instruments and Technology
Subtitle of host publicationOptoelectronic Imaging/Spectroscopy and Signal Processing Technology
EditorsGuohai Situ, Xun Cao, Xiaopeng Shao, Chao Zuo, Wolfgang Osten
PublisherSPIE
ISBN (Electronic)9781510655676
DOIs
Publication statusPublished - 2022
Event2021 International Conference on Optical Instruments and Technology: Optoelectronic Imaging/Spectroscopy and Signal Processing Technology - Virtual, Online, China
Duration: 8 Apr 202210 Apr 2022

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume12281
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

Conference2021 International Conference on Optical Instruments and Technology: Optoelectronic Imaging/Spectroscopy and Signal Processing Technology
Country/TerritoryChina
CityVirtual, Online
Period8/04/2210/04/22

Keywords

  • X-ray imaging
  • security inspection
  • super resolution

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