Sub-wavelength imaging and negative refraction measurement of triangle prism

Xujin Yuan; Yongxing Che; Yongfeng Wang; Xiaofeng Yuan

doi:10.1109/PIERS.2016.7734615

Sub-wavelength imaging and negative refraction measurement of triangle prism

Xujin Yuan, Yongxing Che, Yongfeng Wang, Xiaofeng Yuan

Science and Technology on Electromagnetic Scattering Laboratory

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Citation (Scopus)

Abstract

Sub-wavelength imaging, which can transform evanescent wave into travelling wave and utilize wave component with small wave-vector, is receiving much study interest. Both negative refraction and beam forming can realize sub-wavelength imaging, and their mechanism are analyzed and compared. The refraction behavior under different incident angle is measured experimentally, and it is found that larger incident angle is better for near field energy transfer, while smaller incident angle is better for detection application.

Original language	English
Title of host publication	2016 Progress In Electromagnetics Research Symposium, PIERS 2016 - Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	1182-1184
Number of pages	3
ISBN (Electronic)	9781509060931
DOIs	https://doi.org/10.1109/PIERS.2016.7734615
Publication status	Published - 3 Nov 2016
Externally published	Yes
Event	2016 Progress In Electromagnetics Research Symposium, PIERS 2016 - Shanghai, China Duration: 8 Aug 2016 → 11 Aug 2016

Publication series

Name	2016 Progress In Electromagnetics Research Symposium, PIERS 2016 - Proceedings

Conference

Conference	2016 Progress In Electromagnetics Research Symposium, PIERS 2016
Country/Territory	China
City	Shanghai
Period	8/08/16 → 11/08/16

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10.1109/PIERS.2016.7734615

Cite this

Yuan, X., Che, Y., Wang, Y., & Yuan, X. (2016). Sub-wavelength imaging and negative refraction measurement of triangle prism. In 2016 Progress In Electromagnetics Research Symposium, PIERS 2016 - Proceedings (pp. 1182-1184). Article 7734615 (2016 Progress In Electromagnetics Research Symposium, PIERS 2016 - Proceedings). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PIERS.2016.7734615

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title = "Sub-wavelength imaging and negative refraction measurement of triangle prism",

abstract = "Sub-wavelength imaging, which can transform evanescent wave into travelling wave and utilize wave component with small wave-vector, is receiving much study interest. Both negative refraction and beam forming can realize sub-wavelength imaging, and their mechanism are analyzed and compared. The refraction behavior under different incident angle is measured experimentally, and it is found that larger incident angle is better for near field energy transfer, while smaller incident angle is better for detection application.",

author = "Xujin Yuan and Yongxing Che and Yongfeng Wang and Xiaofeng Yuan",

note = "Publisher Copyright: {\textcopyright} 2016 IEEE.; 2016 Progress In Electromagnetics Research Symposium, PIERS 2016 ; Conference date: 08-08-2016 Through 11-08-2016",

year = "2016",

month = nov,

day = "3",

doi = "10.1109/PIERS.2016.7734615",

language = "English",

series = "2016 Progress In Electromagnetics Research Symposium, PIERS 2016 - Proceedings",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "1182--1184",

booktitle = "2016 Progress In Electromagnetics Research Symposium, PIERS 2016 - Proceedings",

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}

Yuan, X, Che, Y, Wang, Y & Yuan, X 2016, Sub-wavelength imaging and negative refraction measurement of triangle prism. in 2016 Progress In Electromagnetics Research Symposium, PIERS 2016 - Proceedings., 7734615, 2016 Progress In Electromagnetics Research Symposium, PIERS 2016 - Proceedings, Institute of Electrical and Electronics Engineers Inc., pp. 1182-1184, 2016 Progress In Electromagnetics Research Symposium, PIERS 2016, Shanghai, China, 8/08/16. https://doi.org/10.1109/PIERS.2016.7734615

Sub-wavelength imaging and negative refraction measurement of triangle prism. / Yuan, Xujin; Che, Yongxing; Wang, Yongfeng et al.
2016 Progress In Electromagnetics Research Symposium, PIERS 2016 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2016. p. 1182-1184 7734615 (2016 Progress In Electromagnetics Research Symposium, PIERS 2016 - Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Sub-wavelength imaging and negative refraction measurement of triangle prism

AU - Yuan, Xujin

AU - Che, Yongxing

AU - Wang, Yongfeng

AU - Yuan, Xiaofeng

PY - 2016/11/3

Y1 - 2016/11/3

N2 - Sub-wavelength imaging, which can transform evanescent wave into travelling wave and utilize wave component with small wave-vector, is receiving much study interest. Both negative refraction and beam forming can realize sub-wavelength imaging, and their mechanism are analyzed and compared. The refraction behavior under different incident angle is measured experimentally, and it is found that larger incident angle is better for near field energy transfer, while smaller incident angle is better for detection application.

AB - Sub-wavelength imaging, which can transform evanescent wave into travelling wave and utilize wave component with small wave-vector, is receiving much study interest. Both negative refraction and beam forming can realize sub-wavelength imaging, and their mechanism are analyzed and compared. The refraction behavior under different incident angle is measured experimentally, and it is found that larger incident angle is better for near field energy transfer, while smaller incident angle is better for detection application.

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DO - 10.1109/PIERS.2016.7734615

M3 - Conference contribution

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T3 - 2016 Progress In Electromagnetics Research Symposium, PIERS 2016 - Proceedings

SP - 1182

EP - 1184

BT - 2016 Progress In Electromagnetics Research Symposium, PIERS 2016 - Proceedings

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2016 Progress In Electromagnetics Research Symposium, PIERS 2016

Y2 - 8 August 2016 through 11 August 2016

ER -

Yuan X, Che Y, Wang Y, Yuan X. Sub-wavelength imaging and negative refraction measurement of triangle prism. In 2016 Progress In Electromagnetics Research Symposium, PIERS 2016 - Proceedings. Institute of Electrical and Electronics Engineers Inc. 2016. p. 1182-1184. 7734615. (2016 Progress In Electromagnetics Research Symposium, PIERS 2016 - Proceedings). doi: 10.1109/PIERS.2016.7734615

Sub-wavelength imaging and negative refraction measurement of triangle prism

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