TY - GEN
T1 - Study on time delay measurement technology in distributed test system
AU - Mou, Zonglei
AU - Song, Ping
AU - Chen, Xiaoxiao
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2017/6/15
Y1 - 2017/6/15
N2 - The distributed test system is a complex control system which is based on computer technology, network communication technology and sensor technology. In the distributed test system, each testing device communicates with the data control center in a wired or wireless way, and realizing the unified control of the test equipment and the centralized processing of the collected data. Different from the independent test system, in the network distributed test system, each test device needs to communicate with the data control center to complete the corresponding test task. In the signal transmission, different transmission distances will cause the difference delay while the data control center has sent the homologous signal to different test devices. Furthermore, if the test devices in the system do not have a unified time base, the test data will not be able to reflect the true information in the reason of clock difference. Therefore, all the test devices in the network need to know the delay between themselves and the data control center in order to ensure the real-time information between each other. That is, all the devices in the test network need to keep clock synchronization. The authors presented a time delay measurement method which based on FPGA, in the view of the requirement of clock synchronization in distributed test system and the requirement of high precision delay measurement in transmission line of linear topology. The realization principle of delay measurement method from software and hardware is expounded in detail, and the function simulation and experiment verification are carried out. The experimental results show that this method is simple and practical, and it can realize the high-precision delay measurement of the transmission link. It is an effective delay measurement method in the distributed test system.
AB - The distributed test system is a complex control system which is based on computer technology, network communication technology and sensor technology. In the distributed test system, each testing device communicates with the data control center in a wired or wireless way, and realizing the unified control of the test equipment and the centralized processing of the collected data. Different from the independent test system, in the network distributed test system, each test device needs to communicate with the data control center to complete the corresponding test task. In the signal transmission, different transmission distances will cause the difference delay while the data control center has sent the homologous signal to different test devices. Furthermore, if the test devices in the system do not have a unified time base, the test data will not be able to reflect the true information in the reason of clock difference. Therefore, all the test devices in the network need to know the delay between themselves and the data control center in order to ensure the real-time information between each other. That is, all the devices in the test network need to keep clock synchronization. The authors presented a time delay measurement method which based on FPGA, in the view of the requirement of clock synchronization in distributed test system and the requirement of high precision delay measurement in transmission line of linear topology. The realization principle of delay measurement method from software and hardware is expounded in detail, and the function simulation and experiment verification are carried out. The experimental results show that this method is simple and practical, and it can realize the high-precision delay measurement of the transmission link. It is an effective delay measurement method in the distributed test system.
KW - Clock synchronization
KW - Delay measurement
KW - Distributed test
KW - FPGA
KW - Linear topological structure
UR - http://www.scopus.com/inward/record.url?scp=85024487726&partnerID=8YFLogxK
U2 - 10.1109/PIC.2016.7949551
DO - 10.1109/PIC.2016.7949551
M3 - Conference contribution
AN - SCOPUS:85024487726
T3 - PIC 2016 - Proceedings of the 2016 IEEE International Conference on Progress in Informatics and Computing
SP - 498
EP - 502
BT - PIC 2016 - Proceedings of the 2016 IEEE International Conference on Progress in Informatics and Computing
A2 - Wang, Yinglin
A2 - Sun, Yaoru
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 4th IEEE International Conference on Progress in Informatics and Computing, PIC 2016
Y2 - 23 December 2016 through 25 December 2016
ER -