@inproceedings{c549584fdb524df0ae7374e887ce9fce,
title = "Study on the Reliability Index System of Army's Operational Command Network",
abstract = "With the advancement of the army's informatization construction, the operational capability of the system based on information system has become the basic form of combat effectiveness. Command network system reliability is the key link that affects system Army's operational capability. This article mainly analyzes the internal and external influencing factors of the network based on the structure and characteristics of the Army's operational command network. By referring to the research results of the reliability index system of complex networks and communication networks, the author establishes the command network reliability index system according to the equipment layer, physical layer and business layer and gives the mutual conversion relationship between the indicators, and analyzes the rationality of the index system. The results of the research can provide the index support for the demonstration, test and evaluation of Army's operational command network. They can also provide reference for further research on the reliability of weaponry and equipment systems. Furthermore, it is the foundation of determining the cause and location of the Army's operational command system failures and predicting the potential failure of the system, so as for the maintenance and diagnosis of the Army's operational command system.",
keywords = "Army's operational command network, Index system, Reliability",
author = "Yang, {Yuan Yuan} and Mu, {Hui Na} and Peng Hou and Yi, {Xiao Jian} and Yang, {Xiao Yu} and Li Cheng",
note = "Publisher Copyright: {\textcopyright} 2018 IEEE.; 2018 International Conference on Sensing, Diagnostics, Prognostics, and Control, SDPC 2018 ; Conference date: 15-08-2018 Through 17-08-2018",
year = "2018",
month = jul,
day = "2",
doi = "10.1109/SDPC.2018.8664930",
language = "English",
series = "Proceedings - 2018 International Conference on Sensing, Diagnostics, Prognostics, and Control, SDPC 2018",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "537--542",
editor = "Chuan Li and Dian Wang and Diego Cabrera and Yong Zhou and Chunlin Zhang",
booktitle = "Proceedings - 2018 International Conference on Sensing, Diagnostics, Prognostics, and Control, SDPC 2018",
address = "United States",
}