Study on spectral calibration of an ultraviolet Fourier Transform imaging Spectrometer with high precision

Wenming Yang, Ningfang Liao, Haobo Cheng, Yasheng Li, Xueqiong Bai, Chengyang Deng

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Citations (Scopus)

Abstract

In this paper, we reported the laboratory spectral calibration of an ultraviolet (UV) Fourier transform imaging spectrometer (FTIS). A short overview of the designed UV-FTIS, which feature with a Cassegrain objective, an Offner relay optics system and a spatial-And-Temporal modulation Michelson structure, is given. The experimental setup of spectral calibration is described, including details of the light source and integrating sphere. A high pressure mercury lamp was used to acquire reference spectrum. We calculated the all optical path difference (OPD) to achieve spectral response of every wavelength sample and divided the position of reference peak to subpixel to increase the precision of spectral calibration. The spectrum of spectral calibration show two weakly responded peaks, which was validated by reference spectrum of fiber optic spectrometer. The deviation of wavelength calibration is low to establish a best spectrometer resolution. The results of spectral calibration can meet the requirements of the UV-FTIS application.

Original languageEnglish
Title of host publication2017 International Conference on Optical Instruments and Technology
Subtitle of host publicationOptoelectronic Imaging/Spectroscopy and Signal Processing Technology
EditorsGuohai Situ, Wolfgang Osten, Xun Cao
PublisherSPIE
ISBN (Electronic)9781510617513
DOIs
Publication statusPublished - 2018
Event2017 International Conference on Optical Instruments and Technology: Optoelectronic Imaging/Spectroscopy and Signal Processing Technology, OIT 2017 - Beijing, China
Duration: 28 Oct 201730 Oct 2017

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume10620
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

Conference2017 International Conference on Optical Instruments and Technology: Optoelectronic Imaging/Spectroscopy and Signal Processing Technology, OIT 2017
Country/TerritoryChina
CityBeijing
Period28/10/1730/10/17

Keywords

  • Fourier transform spectrometer
  • Spectral calibration
  • Ultraviolet

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