Study on high-temperature transformation and dielectric properties of silicon resin/silicon dioxide composite

Mao Sheng Cao*, Liang Zhang, Jin Gang Li, Zhi Ling Hou, Fu Chi Wang

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)

Abstract

Silicon dioxide based composite with a few silicon resin was ablated quickly by oxyacetylene spraying gun, and was characterized by x-ray diffraction, electron microscope and selective area electron diffraction. It was found that there are a few α-cristobalite crystallization and α-silicon carbide, β-silicon carbide formation. Based on experiments above, the relationship between physical and chemical states transformation of materials and high-temperature dielectric properties was studied.

Original languageEnglish
Pages (from-to)420-423
Number of pages4
JournalCailiao Kexue yu Gongyi/Material Science and Technology
Volume14
Issue number4
Publication statusPublished - Aug 2006

Keywords

  • Characterization
  • Dielectric properties
  • Silicon dioxide
  • Silicon resin
  • Transformation

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