Abstract
Silicon dioxide based composite with a few silicon resin was ablated quickly by oxyacetylene spraying gun, and was characterized by x-ray diffraction, electron microscope and selective area electron diffraction. It was found that there are a few α-cristobalite crystallization and α-silicon carbide, β-silicon carbide formation. Based on experiments above, the relationship between physical and chemical states transformation of materials and high-temperature dielectric properties was studied.
Original language | English |
---|---|
Pages (from-to) | 420-423 |
Number of pages | 4 |
Journal | Cailiao Kexue yu Gongyi/Material Science and Technology |
Volume | 14 |
Issue number | 4 |
Publication status | Published - Aug 2006 |
Keywords
- Characterization
- Dielectric properties
- Silicon dioxide
- Silicon resin
- Transformation