TY - JOUR
T1 - Study on fault diagnostic strategy of intelligent magnetic detection microsystems
AU - Wang, Yongqiang
AU - Lou, Wenzhong
AU - Fan, Ningjun
AU - Hao, Jianwei
AU - Zhang, Dayin
PY - 2009/1
Y1 - 2009/1
N2 - Intelligent Magnetic Detection Microsystems (IMDM) are complex microsystems, which are used to obtain the information of motor flux and speed in single-driveway traffic system; the microsystems have to fulfill the task in a harsh environment of field, which would infect the reliability of system. An effective method to ensure maintenance cost and reliability is to integrate efficient built-in-test and monitoring function into IMDM, so testability analysis is introduced in the design of Microsystems. The Microsystems testing-points and diagnostic strategy are reasonably identified, which are beneficial to implement the rapid detection and fault isolation. This paper presents an approach to construct a fault message matrix based on the functional block diagram and signal flow chart of the microsystems. By analyzing the contribution of the testing-points to fault detection and fault isolation, the matrix is resolved step by step, the most necessary testing-points are identified and optimal diagnostic strategy is determined. Thus, the purpose of fault detection and fault isolation is achieved by the use of the fewest testing-points and short time.
AB - Intelligent Magnetic Detection Microsystems (IMDM) are complex microsystems, which are used to obtain the information of motor flux and speed in single-driveway traffic system; the microsystems have to fulfill the task in a harsh environment of field, which would infect the reliability of system. An effective method to ensure maintenance cost and reliability is to integrate efficient built-in-test and monitoring function into IMDM, so testability analysis is introduced in the design of Microsystems. The Microsystems testing-points and diagnostic strategy are reasonably identified, which are beneficial to implement the rapid detection and fault isolation. This paper presents an approach to construct a fault message matrix based on the functional block diagram and signal flow chart of the microsystems. By analyzing the contribution of the testing-points to fault detection and fault isolation, the matrix is resolved step by step, the most necessary testing-points are identified and optimal diagnostic strategy is determined. Thus, the purpose of fault detection and fault isolation is achieved by the use of the fewest testing-points and short time.
UR - http://www.scopus.com/inward/record.url?scp=54049086493&partnerID=8YFLogxK
U2 - 10.1007/s00542-008-0674-4
DO - 10.1007/s00542-008-0674-4
M3 - Article
AN - SCOPUS:54049086493
SN - 0946-7076
VL - 15
SP - 89
EP - 94
JO - Microsystem Technologies
JF - Microsystem Technologies
IS - 1 SPEC. ISS.
ER -