Study on camouflage effect of targets with different characteristics under typical background

Shaoshu Gao*, Weiqi Jin, Jihui Wang, He Wang, Hailan Li, Aiyan Guo

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

5 Citations (Scopus)

Abstract

With the rapid development of infrared detecting and homing technology, it is important for us to analyze infrared camouflage effect of ground targets to improve the survivability. In the paper, factors such as the effect of atmosphere between detectors and targets, characteristics of targets and background and atmospheric radiance including directly transmitted solar irradiance are taken into account in long-distance detecting. The concept of RARD (relative apparent radiance difference) between targets and background is proposed and the camouflage effect of ground targets can be evaluated precisely. MODTRAN 4.0 is used to analyze the camouflage effect of targets. In MODTRAN, solar zenith angle, common background, emissivity and temperature of targets are selected to calculate RARD under certain atmosphere condition. Simulation results show that RARD is affected by the solar zenith angle significantly in middle infrared wavelength region, but hardly in long-wave infrared region. Under the special background, according to the target temperature, proper coating with unchanged emissivity is selected to camouflage the target all day in long-wave infrared region. However, for the changing background, the stealth coating with variable emissivity should be adopted. In addition, for the same target, it is even more difficult to achieve good camouflage effect at both medium infrared band and long wave infrared band.

Original languageEnglish
Title of host publication5th International Symposium on Advanced Optical Manufacturing and Testing Technologies
Subtitle of host publicationOptical Test and Measurement Technology and Equipment
EditionPART 1
DOIs
Publication statusPublished - 2010
Event5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Dalian, China
Duration: 26 Apr 201029 Apr 2010

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
NumberPART 1
Volume7656
ISSN (Print)0277-786X

Conference

Conference5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Country/TerritoryChina
CityDalian
Period26/04/1029/04/10

Keywords

  • MODTRAN
  • ground target
  • infrared camouflage
  • solar zenith angle

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