Strain-assisted current-induced magnetization reversal in magnetic tunnel junctions: A micromagnetic study with phase-field microelasticity

H. B. Huang*, J. M. Hu, T. N. Yang, X. Q. Ma, L. Q. Chen

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

13 Citations (Scopus)

Abstract

Effect of substrate misfit strain on current-induced in-plane magnetization reversal in CoFeB-MgO based magnetic tunnel junctions is investigated by combining micromagnetic simulations with phase-field microelasticity theory. It is found that the critical current density for in-plane magnetization reversal decreases dramatically with an increasing substrate strain, since the effective elastic field can drag the magnetization to one of the four in-plane diagonal directions. A potential strain-assisted multilevel bit spin transfer magnetization switching device using substrate misfit strain is also proposed.

Original languageEnglish
Article number122407
JournalApplied Physics Letters
Volume105
Issue number12
DOIs
Publication statusPublished - 22 Sept 2014
Externally publishedYes

Fingerprint

Dive into the research topics of 'Strain-assisted current-induced magnetization reversal in magnetic tunnel junctions: A micromagnetic study with phase-field microelasticity'. Together they form a unique fingerprint.

Cite this