Spectral Detection Adversary for confronting against spectral-based object detection

Yinuo Zhang, Liheng Bian*

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Spectral images provide rich spatial and spectral information, enabling quantitative analysis of the same material and qualitative analysis of different materials. Due to the outstanding material identification capabilities of spectral technology, it is widely used in high-precision target detection tasks in complex scenes. Currently, adversarial sample attack techniques are advancing rapidly, however, most research on adversarial sample attacks in the field of object detection has been focused on RGB three-channel images. The exploration of adversarial techniques for object detection in multi-channel spectral images is still in its early stages. In this work, we propose a method for adversarial sample generation based on spectral images, which belongs to black-box attack and targeted attack. The reported technique, named Spectral Detection Adversary (SDA), is utilized to cause spectral image object detection networks to misclassify camouflage targets as real targets. We introduce a spectral analysis and comparison method to distinguish between real targets and camouflage targets, additionally, we propose a spectral dimension encoding method for various categories of real and camouflaged targets, thereby causing disruption in the adversary's spectral image object detection network. In the most effective group, experimental verification revealed a reduction of more than 60% in the recall of camouflaged targets and a decrease of over 30% in the precision of real targets.

Original languageEnglish
Title of host publicationOptoelectronic Imaging and Multimedia Technology X
EditorsQionghai Dai, Tsutomu Shimura, Zhenrong Zheng
PublisherSPIE
ISBN (Electronic)9781510667839
DOIs
Publication statusPublished - 2023
EventOptoelectronic Imaging and Multimedia Technology X 2023 - Beijing, China
Duration: 15 Oct 202316 Oct 2023

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume12767
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceOptoelectronic Imaging and Multimedia Technology X 2023
Country/TerritoryChina
CityBeijing
Period15/10/2316/10/23

Keywords

  • Adversarial sample attack
  • Deep learning
  • Object detection
  • Spectral imaging

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