Solid-State Beam Scanner Based on VCSEL Integrated Amplifier with Scan Resolution of over 200

Shanting Hu, Masashi Takanohashi, Xiaodong Gu, Keisuke Shimura, Fumio Koyama

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We demonstrate a solid-state beam scanner based on VC SEL-integrated amplifier for 3D sensing. We realized a record beam-steering angle of 16° with 200 resolution points. The integrated chip size is as small as 1 mm.

Original languageEnglish
Title of host publication2020 Conference on Lasers and Electro-Optics, CLEO 2020 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781943580767
Publication statusPublished - May 2020
Externally publishedYes
Event2020 Conference on Lasers and Electro-Optics, CLEO 2020 - San Jose, United States
Duration: 10 May 202015 May 2020

Publication series

NameConference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS
Volume2020-May
ISSN (Print)1092-8081

Conference

Conference2020 Conference on Lasers and Electro-Optics, CLEO 2020
Country/TerritoryUnited States
CitySan Jose
Period10/05/2015/05/20

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