SMD reliability research base on Stolkarts fatigue model

Zhao Wang*, Heming Zhao, Wenzhong Lou, Hanwei Li, Li Jin

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The article mainly focus on the reliability of the solder joints between the PCB and SMD in the situation like transporting and restoring, etc, provide theory evidence to enhance the reliability of such devices, ANSYS simulation tool serviced for modeling PCB, SMD and the joint structures, analyzed the maximum and the minimum stress position of the model, lower stress was loaded on the model to simulate the transferring action, then based on the Stolkarts fatigue model to predict the lifetime of these components, calculated the theory lifetime of the model, compared with the experiment, finally proved that Stolkarts fatigue model has actual ability to calculate the lifetime of devices which under certain stress value.

Original languageEnglish
Title of host publicationICEPT-HDP 2011 Proceedings - 2011 International Conference on Electronic Packaging Technology and High Density Packaging
Pages673-676
Number of pages4
DOIs
Publication statusPublished - 2011
Event2011 12th International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2011 - Shanghai, China
Duration: 8 Aug 201111 Aug 2011

Publication series

NameICEPT-HDP 2011 Proceedings - 2011 International Conference on Electronic Packaging Technology and High Density Packaging

Conference

Conference2011 12th International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2011
Country/TerritoryChina
CityShanghai
Period8/08/1111/08/11

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