Scheduling for semiconductor assembly and test manufacturing enterprise

Yaoguang Hu, Jiawei Ke, Jiawei Yan, Jingqian Wen

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Semiconductor assembly and test manufacturing enterprise belong to the model of multi-specification and small-batch. It's a great challenge to make a production planning under uncertainty product categories and batches. Furthermore, product delivery time is very strict in the enterprise. Consequently, it's a key issue to develop a reasonable production planning to ensure the timely completion of the production tasks in the actual production environment. With the analysis of the production process, burn-in process is the common process from different production lines. Burn-in process has several different devices for the burn-in of different products. This paper focuses on the key process batch scheduling problem. The problem is formulated into Integer Linear Programming (ILP), considering the constraints of devices, production capacity and delivery time. The optimization goal of the model is to minimize the production time. Firstly, heuristics is used to solve the order batching and the batch sorting. And then the adaptable genetic algorithm is put forward to solve the ILP. The proposed method is demonstrated by an experimental case within acceptable computational time. Result analysis verifies the validity of the algorithm and implements production planning optimization.

Original languageEnglish
Title of host publicationProceedings of the 2015 10th IEEE Conference on Industrial Electronics and Applications, ICIEA 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages891-896
Number of pages6
ISBN (Electronic)9781467373173
DOIs
Publication statusPublished - 20 Nov 2015
Event10th IEEE Conference on Industrial Electronics and Applications, ICIEA 2015 - Auckland, New Zealand
Duration: 15 Jun 201517 Jun 2015

Publication series

NameProceedings of the 2015 10th IEEE Conference on Industrial Electronics and Applications, ICIEA 2015

Conference

Conference10th IEEE Conference on Industrial Electronics and Applications, ICIEA 2015
Country/TerritoryNew Zealand
CityAuckland
Period15/06/1517/06/15

Keywords

  • genetic algorithm
  • multi-specification and small-batch
  • production scheduling
  • semiconductor assembly and test manufacturing

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