TY - GEN
T1 - Retinal vessel profiling based on four piecewise Gaussian model
AU - Ma, Zhiyang
AU - Li, Huiqi
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2015/9/9
Y1 - 2015/9/9
N2 - Retinal vessel profiling in ocular fundus images is a basic tool to measure and detect retinal vascular structure, which can provide important information to clinical diagnosis and medical research. In this paper, a four-piecewise Gaussian model is proposed to describe the intensity distribution of retinal vascular cross-section. Eight hundred seventy three vessel profiles from 34 color fundus images were tested and best-fit parameters were obtained using Levenberg-Marquardt method. The mean squared error of the four-piecewise Gaussian model is about 0.18. The proposed model can describe the vessel profile with or without central reflex, and the profile with non-uniform background well.
AB - Retinal vessel profiling in ocular fundus images is a basic tool to measure and detect retinal vascular structure, which can provide important information to clinical diagnosis and medical research. In this paper, a four-piecewise Gaussian model is proposed to describe the intensity distribution of retinal vascular cross-section. Eight hundred seventy three vessel profiles from 34 color fundus images were tested and best-fit parameters were obtained using Levenberg-Marquardt method. The mean squared error of the four-piecewise Gaussian model is about 0.18. The proposed model can describe the vessel profile with or without central reflex, and the profile with non-uniform background well.
KW - four piecewise Gaussian model
KW - retinal image
KW - retinal vessel profile
UR - http://www.scopus.com/inward/record.url?scp=84961372724&partnerID=8YFLogxK
U2 - 10.1109/ICDSP.2015.7252048
DO - 10.1109/ICDSP.2015.7252048
M3 - Conference contribution
AN - SCOPUS:84961372724
T3 - International Conference on Digital Signal Processing, DSP
SP - 1094
EP - 1097
BT - 2015 IEEE International Conference on Digital Signal Processing, DSP 2015
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - IEEE International Conference on Digital Signal Processing, DSP 2015
Y2 - 21 July 2015 through 24 July 2015
ER -