Research on the RCS of serrate gap in real aircraft state

Jingcheng Zhao, Hangyu Chen, Xiuzhu Ye

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Citations (Scopus)

Abstract

Serrate gaps, as weak scattering sources, are distributed on the surface of aircrafts to affect their stealth performance. Therefore, to obtain the accurate RCS of such gaps in the real aircraft state is of great significance. This study proposes a carrier cancellation method to obtain the RCS scattering characteristics of serrate gaps under the real state of the aircrafts. Commercial software such as FEKO and MATLAB are utilized to implement the ISAR imaging validation of the method. The simulation results show that the gap self-scattering can be obtained accurately by the proposed method. Using this technique, the RCS of serrate gaps are computed under electromagnetic wave irradiation under different frequencies and polarizations.

Original languageEnglish
Title of host publication2018 18th IEEE International Conference on Communication Technology, ICCT 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages338-341
Number of pages4
ISBN (Electronic)9781538676349
DOIs
Publication statusPublished - 2 Jan 2019
Externally publishedYes
Event2018 18th IEEE International Conference on Communication Technology, ICCT 2018 - Chongqing, China
Duration: 8 Oct 201811 Oct 2018

Publication series

NameInternational Conference on Communication Technology Proceedings, ICCT
Volume2019-October

Conference

Conference2018 18th IEEE International Conference on Communication Technology, ICCT 2018
Country/TerritoryChina
CityChongqing
Period8/10/1811/10/18

Keywords

  • Carrier cancellation
  • Microwave imaging
  • RCS
  • Serrate gap

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Cite this

Zhao, J., Chen, H., & Ye, X. (2019). Research on the RCS of serrate gap in real aircraft state. In 2018 18th IEEE International Conference on Communication Technology, ICCT 2018 (pp. 338-341). Article 8600128 (International Conference on Communication Technology Proceedings, ICCT; Vol. 2019-October). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICCT.2018.8600128