Research on High Diffraction Efficiency X-ray Fluorescence Spot Generation Technology for X-ray Fluorescence Spectrometer

Zhewei Cao*, Qi Zhang, Ran Gao, Yun Teng, Lan Rao, Zeyuan Chang

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The generation of X-ray fluorescence spot plays an important role in X-ray fluorescence spectrometer, and its diffraction efficiency determines the performance of the instrument. In order to improve the resolution of X-ray fluorescence spectrometer, a method to improve the diffraction efficiency of X-ray fluorescence spot was proposed. The diffraction efficiency of the X-ray fluorescence spot is improved by studying the deviation between the aperture of the grating and the hole center, and the relationship between the distance between the sample groove and the spectroscopic crystal and the count value. Experiments show that the size of the light spot is reduced by 50% and the diffraction efficiency is increased by 3.6% after the improvement of the optical path.

Original languageEnglish
Title of host publication2022 Asia Communications and Photonics Conference, ACP 2022 and International Conference on Information Photonics and Optical Communications, IPOC 2022
PublisherOptica Publishing Group (formerly OSA)
Pages1612-1616
Number of pages5
ISBN (Electronic)9781665481557
DOIs
Publication statusPublished - 2022
Event2022 Asia Communications and Photonics Conference, ACP 2022 and International Conference on Information Photonics and Optical Communications, IPOC 2022 - Shenzhen, China
Duration: 5 Nov 20228 Nov 2022

Publication series

NameAsia Communications and Photonics Conference, ACP
Volume2022-November
ISSN (Print)2162-108X

Conference

Conference2022 Asia Communications and Photonics Conference, ACP 2022 and International Conference on Information Photonics and Optical Communications, IPOC 2022
Country/TerritoryChina
CityShenzhen
Period5/11/228/11/22

Keywords

  • grating aperture
  • hole center offset
  • ray fluorescence spectrometer
  • sample slot distance

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