Research advances on optical non-contact measurement of profiles

Yan Shang*, Chun Guang Xu

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)

Abstract

The accurate measurement to the surface outline, geometry dimension, various mould and free surface is an important step to improve the digitalization manufacture level of parts. The methods of optical non-contact measurement and the key technologies are discussed. The methods of optical non-contact measurement can be decided into two classes, they are passive method and active method. Different kinds of technologies for optical non-contact measuring are introduced. The key technologies and developing trend were discussed.

Original languageEnglish
Pages (from-to)216-217+220
JournalGuangxue Jishu/Optical Technique
Volume34
Issue numberSUPPL.
Publication statusPublished - Dec 2008

Keywords

  • Developing trend
  • Key technology
  • Optical non-contact measurement
  • Profile measurement

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